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Subject Test Using Electroencephalogram According to Variation of Autostereoscopic Image Quality
Jae-Chul Moon , Jong-Ui Hong , Yoo-Joo Choi , Jung-Keun Suh KIPS Transactions on Software and Data Engineering,
Vol. 5, No. 4, pp. 195-202,
Apr.
2016
10.3745/KTSDE.2016.5.4.195
10.3745/KTSDE.2016.5.4.195
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Vol. 1, 2012
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All publications of KTSDE is indexed in DOI, EBSCO, Google Scholar, Crossref, and CrossCheck.
KTSDE is also selected as the Journal for Accreditation by NRF (National Research Foundation of Korea).
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